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Study of the bending modulus of individual silicon nitride nanobelts via atomic force microscopy

GY Jing, H Ji, WY Yang, J Xu, DP Yu

Surface effects on elastic properties of silver nanowires: contact atomic-force microscopy

GY Jing, H_L Duan, XM Sun, ZS Zhang, J Xu, YD Li, JX Wang, DP Yu

Electrical conductivity of a single C 60 nanotube

YJ Xing, GY Jing, J Xu, DP Yu, HB Liu, YL Li

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